(Read free) Electrical Overstress (EOS): Devices, Circuits and Systems
♥ Steven H. Voldman ♥
| #3279892 in Books | Wiley | 2013-10-28 | Original language:English | PDF # 1 | 9.90 x.90 x7.00l,1.55 | File Name: 1118511883 | 368 pages |
||1 of 1 people found the following review helpful.| Not recommended.|By Customer|Dr.Voldman may be an esd expert. But I didn't get much information from this book. Repeated sentences often seen in the text. Not recommended.|From the Back Cover||Electrical Overstress (EOS) continues to impact semiconductor manufacturing, semiconductor components and systems as technologies scale from micro- to nano-electronics. This book teaches the fundamentals of electrical overstress
Electrical Overstress (EOS) continues to impact semiconductor manufacturing, semiconductor components and systems as technologies scale from micro- to nano-electronics. This bookteaches the fundamentals of electrical overstress and how to minimize and mitigate EOS failures. The text provides a clear picture of EOS phenomena, EOS origins, EOS sources, EOS physics, EOS failure mechanisms, and EOS on-chip and system design. It provides an illuminating ...
[PDF.kc03] Electrical Overstress (EOS): Devices, Circuits and Systems Rating: 4.78 (770 Votes)
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