[Download pdf] Astonishing Legends Electromigration in Thin Films and Electronic Devices: Materials and Reliability (Woodhead Publishing Series in Electronic and Optical Materials)
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| #5055111 in Books | 2011-09-11 | Original language:English | PDF # 1 | 9.21 x.81 x6.14l,1.48 | File Name: 1845699378 | 352 pages
||About the Author|Choong-Un Kim is Professor of Materials Science and Engineering at the University of Texas at Arlington, USA.
Understanding and limiting electromigration in thin films is essential to the continued development of advanced copper interconnects for integrated circuits. Electromigration in thin films and electronic devices provides an up-to-date review of key topics in this commercially important area.
Part one consists of three introductory chapters, covering modelling of electromigration phenomena, modelling electromigration using the peridynamics approach and simulation ...
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