[Read and download] Fundamentals of Bias Temperature Instability in MOS Transistors: Characterization Methods, Process and Materials Impact, DC and AC Modeling (Springer Series in Advanced Microelectronics)
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| #3278504 in Books | 2015-08-06 | Original language:English | PDF # 1 | 9.47 x.78 x6.22l,.0 | File Name: 8132225074 | 269 pages
This book aims to cover different aspects of Bias Temperature Instability (BTI). BTI remains as an important reliability concern for CMOS transistors and circuits. Development of BTI resilient technology relies on utilizing artefact-free stress and measurement methods and suitable physics-based models for accurate determination of degradation at end-of-life and understanding the gate insulator process impact on BTI. This book discusses different ultra-fast characteri...
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You easily download any file type for your gadget.Fundamentals of Bias Temperature Instability in MOS Transistors: Characterization Methods, Process and Materials Impact, DC and AC Modeling (Springer Series in Advanced Microelectronics) | From Springer. I have read it a couple of times and even shared with my family members. Really good. Couldnt put it down.
